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Microscopy services with MicroVision Laboratories, Inc. today? Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.
SEM is a powerful surface microscopy method which allows for high resolution images to be obtained on a wide range of samples. A focused beam of electrons sweeps across a sample surface and an image is created from the scattered electrons. The electron beam allows for the accurate imaging of features below the resolution limit of visible light. The acquired pictures retain good depth of field, resulting in excellent three-dimensional images. Variations in beam parameters can be made in order to highlight variations in density in the target sample, show extremely fine surface features, and illustrate texture in sample surface coatings. MicroVision Labs has multiple fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, and large chamber capabilities. These provide a full suite of microscopy services for all of your analytical needs.
What if I want a service not listed in your services list? At MicroVision Labs the list of services which we provide to our clients is constantly growing. So if you don’t see what you are looking for give us a call or use the Contact Us tab. Also don’t forget to check our Additional Services Page to see if it might be listed there. Can you identify a contamination or unknown for us? Yes, we call that an Unknown Material ID and we routinely work on that kind of project. We have a number of individual tests designed to classify unknown materials. When combined with our extensive suite of equipment, these tests allow us to identify virtually any material. Give us a call and talk to one of our knowledgeable staff for more information. Find extra info on find more info. MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile.
The client was able to obtain a comprehensive sampling of the state of the soldering process from the new manufacturer at a very reasonable cost. Rather than acquiring a mass of images, electrical test print outs, or low resolution optical pictures, the client received a comprehensive report detailing the relevant findings of the analysis on the boards from the new manufacturer. The solder joints in this study showed good bond integrity as well as excellent intermetallic layers. These findings allowed for the validation of the new manufacturer and their process which allowed for the clients device production to resume. The QC Engineers were very pleased with the customer service, analysis, pricing and quick turnaround time of this project.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation. Read even more details on microvisionlabs.com.